SEM is a method for high resolution imaging of surfaces. The SEM obtains topographical, as well as composition information, at much greater magnifications and depth of field than is possible with light microscopy. Variable-pressure SEM is a specialized method using a variable-pressure sample chamber. This technique allows direct evaluation of samples that are nonconductive or vacuum sensitive, which are not readily evaluated with tradition SEMs.

Energy dispersive x-ray spectroscopy (EDS) is an elemental microanalysis technique performed in conjunction with SEM. Features or phases as small as about 1 micron can be analyzed. EDS can obtain rapid qualitative chemical information, semiquantitative composition determinations, maps showing lateral distribution of chemical elements, and profiles of composition across a surface.

Metallography is the study of topographical or microstructural features on specially-prepared surfaces - typically polished and chemically etched. The features observed by metallography are directly related to the physical and mechanical properties of the material studied. The MEE metallography laboratory specializes in precision sectioning of miniature devices, including microelectronic components and implantable medical devices.

More details on these and other analytical methods are presented in our HAMM.

• Microscopic feature measurements
• Fracture characterization
• Corrosion evaluations
• Microstructure studies
• Coating evaluations
• Surface contamination analysis
• Rapid material alloy identification
• Small component material analysis
• Laser and resistance weld evaluation
• Printed and integrated circuit analysis