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NEW SEM NOW AVAILABLE!
Materials Evaluation and Engineering, Inc. (MEE) announces the addition of a new Variable Pressure Scanning Electron Microscope (VPSEM, also known as Low Vacuum SEM). This third SEM extends the capabilities and capacity of the laboratory. The new SEM, a JEOL 6610LV, is the latest model manufactured by JEOL with a number of significant improvements over previous models. Enhanced imaging capabilities and larger sample size capacity, along with other new features allows us to get your work done more quickly with superior results. The SEM is coupled with a Noran System 7 energy dispersive x-ray spectroscopy (EDS) elemental analysis instrument. This EDS system uses the latest detector technology and computer control to maximize detection limits and throughput. The combination of SEM and EDS allows for both high resolution imaging and elemental analysis simultaneously.
Along with the Hitachi S4700 Field Emission SEM (FESEM) and the JEOL 5800LV SEM (both with EDS), the new JEOL 6610 LV SEM ensures that MEE has the tools necessary to aid in solving your materials related problems with state of art technology. Please contact MEE to schedule an appointment for the new SEM\EDS or learn more.
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