{"id":1291,"date":"2021-03-23T21:24:11","date_gmt":"2021-03-23T21:24:11","guid":{"rendered":"https:\/\/www.mee-inc.com\/blog\/?p=1291"},"modified":"2021-03-23T21:24:11","modified_gmt":"2021-03-23T21:24:11","slug":"asm-failure-analysis-handbooks","status":"publish","type":"post","link":"https:\/\/www.mee-inc.com\/blog\/?p=1291","title":{"rendered":"ASM Failure Analysis Handbooks"},"content":{"rendered":"<p>The newly revised <a href=\"https:\/\/dl.asminternational.org\/handbooks\/book\/139\/Failure-Analysis-and-Prevention\">ASM Handbook Volume 11<\/a> &#8211; Failure Analysis and Prevention has been released.\u00a0 MEE Professional Engineers, Larry Hanke, Ryan Haase and Neal Hanke all contributed to this latest release.\u00a0 <span id=\"tab-content-description\" class=\"selected\"><\/span>Larry Hanke, P.E. co-authored two articles, <a href=\"https:\/\/doi.org\/10.31399\/asm.hb.v11.a0006769\">Scanning Electron Microscopy for Failure Analysis<\/a> and <a href=\"https:\/\/dl.asminternational.org\/handbooks\/book\/139\/chapter-abstract\/2413901\/X-Ray-Spectroscopy-in-Failure-Analysis?redirectedFrom=fulltext\">X-Ray Spectroscopy in Failure Analysis<\/a> and was Division Editor for the section on Tools and Techniques in Failure Analysis. Ryan and Neal were editors and reviewers for multiple articles within the handbook including the Chemical Analysis section.<\/p>\n<p>ASM Handbooks are a comprehensive multi-volume reference work covering<span class=\"selected\"> every area of materials specialization. The staff at MEE recognizes that <\/span><span id=\"tab-content-description\" class=\"selected\">contributing to their professional organization benefits not just their personal career goals but the overall engineering and scientific community.<br \/>\n<\/span><\/p>\n<div id=\"attachment_1301\" style=\"width: 473px\" class=\"wp-caption alignleft\"><a href=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2021\/03\/ThreePicture1.jpg\"><img loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-1301\" class=\"wp-image-1301 size-full\" src=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2021\/03\/ThreePicture1.jpg\" alt=\"\" width=\"463\" height=\"153\" srcset=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2021\/03\/ThreePicture1.jpg 463w, https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2021\/03\/ThreePicture1-300x99.jpg 300w\" sizes=\"(max-width: 463px) 100vw, 463px\" \/><\/a><p id=\"caption-attachment-1301\" class=\"wp-caption-text\">MEE Engineers Larry Hanke , Ryan Haase, and Neal Hanke<\/p><\/div>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<h1 class=\"chapter-title\"><\/h1>\n","protected":false},"excerpt":{"rendered":"<p>The newly revised ASM Handbook Volume 11 &#8211; Failure Analysis and Prevention has been released.\u00a0 MEE Professional Engineers, Larry Hanke, Ryan Haase and Neal Hanke all contributed to this latest release.\u00a0 Larry Hanke, P.E. co-authored two articles, Scanning Electron Microscopy for Failure Analysis and X-Ray Spectroscopy in Failure Analysis and was Division Editor for the [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_mi_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[18],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.5 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>ASM Failure Analysis Handbooks - MEE<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.mee-inc.com\/blog\/?p=1291\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"ASM Failure Analysis Handbooks - MEE\" \/>\n<meta property=\"og:description\" content=\"The newly revised ASM Handbook Volume 11 &#8211; Failure Analysis and Prevention has been released.\u00a0 MEE Professional Engineers, Larry Hanke, Ryan Haase and Neal Hanke all contributed to this latest release.\u00a0 Larry Hanke, P.E. co-authored two articles, Scanning Electron Microscopy for Failure Analysis and X-Ray Spectroscopy in Failure Analysis and was Division Editor for the [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.mee-inc.com\/blog\/?p=1291\" \/>\n<meta property=\"og:site_name\" content=\"MEE\" \/>\n<meta property=\"article:published_time\" content=\"2021-03-23T21:24:11+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2021\/03\/ThreePicture1.jpg\" \/>\n<meta name=\"author\" content=\"MEE Inc\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"MEE Inc\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=1291\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/?p=1291\",\"name\":\"ASM Failure Analysis Handbooks - MEE\",\"isPartOf\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\"},\"datePublished\":\"2021-03-23T21:24:11+00:00\",\"dateModified\":\"2021-03-23T21:24:11+00:00\",\"author\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\"},\"breadcrumb\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=1291#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.mee-inc.com\/blog\/?p=1291\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=1291#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.mee-inc.com\/blog\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"ASM Failure Analysis Handbooks\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/\",\"name\":\"MEE\",\"description\":\"Materials Evaluation and Engineering, Inc\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.mee-inc.com\/blog\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-US\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\",\"name\":\"MEE Inc\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"caption\":\"MEE Inc\"},\"sameAs\":[\"http:\/\/www.mee-inc.com\"],\"url\":\"https:\/\/www.mee-inc.com\/blog\/?author=2\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"ASM Failure Analysis Handbooks - MEE","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.mee-inc.com\/blog\/?p=1291","og_locale":"en_US","og_type":"article","og_title":"ASM Failure Analysis Handbooks - MEE","og_description":"The newly revised ASM Handbook Volume 11 &#8211; 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