{"id":304,"date":"2016-01-15T00:23:28","date_gmt":"2016-01-15T00:23:28","guid":{"rendered":"http:\/\/www.mee-inc.com\/blog\/?p=304"},"modified":"2016-01-15T00:23:28","modified_gmt":"2016-01-15T00:23:28","slug":"failure-analysis-presentation","status":"publish","type":"post","link":"https:\/\/www.mee-inc.com\/blog\/?p=304","title":{"rendered":"Failure Analysis Presentation"},"content":{"rendered":"<p>Larry Hanke and Dan Grice recently presented a talk on the application of CT imaging for failure analysis and laboratory services to the\u00a0of technical staff and sales representatives of one of our vendors.<\/p>\n<p>Typical failure analysis tasks always include a visual examination, SEM\/EDS examination and microstructure analysis. Three-dimensional X-ray imaging (CT scanning) has become another important tool for failure analysis.<\/p>\n<p><a href=\"http:\/\/www.mee-inc.com\/contact-mee\/\">Contact\u00a0MEE<\/a>\u00a0 to discuss your failure analysis project.\u00a0Failure analysis and advanced research projects are directed by registered professional engineers\u00a0specializing in the behavior of materials and how their structure affects service performance.<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Larry Hanke and Dan Grice recently presented a talk on the application of CT imaging for failure analysis and laboratory services to the\u00a0of technical staff and sales representatives of one of our vendors. Typical failure analysis tasks always include a visual examination, SEM\/EDS examination and microstructure analysis. Three-dimensional X-ray imaging (CT scanning) has become another [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_mi_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[25,24],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.5 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Failure Analysis Presentation - MEE<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.mee-inc.com\/blog\/?p=304\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Failure Analysis Presentation - MEE\" \/>\n<meta property=\"og:description\" content=\"Larry Hanke and Dan Grice recently presented a talk on the application of CT imaging for failure analysis and laboratory services to the\u00a0of technical staff and sales representatives of one of our vendors. Typical failure analysis tasks always include a visual examination, SEM\/EDS examination and microstructure analysis. Three-dimensional X-ray imaging (CT scanning) has become another [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.mee-inc.com\/blog\/?p=304\" \/>\n<meta property=\"og:site_name\" content=\"MEE\" \/>\n<meta property=\"article:published_time\" content=\"2016-01-15T00:23:28+00:00\" \/>\n<meta name=\"author\" content=\"MEE Inc\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"MEE Inc\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=304\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/?p=304\",\"name\":\"Failure Analysis Presentation - MEE\",\"isPartOf\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\"},\"datePublished\":\"2016-01-15T00:23:28+00:00\",\"dateModified\":\"2016-01-15T00:23:28+00:00\",\"author\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\"},\"breadcrumb\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=304#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.mee-inc.com\/blog\/?p=304\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=304#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.mee-inc.com\/blog\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Failure Analysis Presentation\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/\",\"name\":\"MEE\",\"description\":\"Materials Evaluation and Engineering, Inc\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.mee-inc.com\/blog\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-US\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\",\"name\":\"MEE Inc\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"caption\":\"MEE Inc\"},\"sameAs\":[\"http:\/\/www.mee-inc.com\"],\"url\":\"https:\/\/www.mee-inc.com\/blog\/?author=2\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Failure Analysis Presentation - MEE","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.mee-inc.com\/blog\/?p=304","og_locale":"en_US","og_type":"article","og_title":"Failure Analysis Presentation - MEE","og_description":"Larry Hanke and Dan Grice recently presented a talk on the application of CT imaging for failure analysis and laboratory services to the\u00a0of technical staff and sales representatives of one of our vendors. 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