{"id":821,"date":"2018-04-19T21:22:48","date_gmt":"2018-04-19T21:22:48","guid":{"rendered":"https:\/\/www.mee-inc.com\/blog\/?p=821"},"modified":"2018-04-19T21:22:49","modified_gmt":"2018-04-19T21:22:49","slug":"pinpointing-microscopic-targets","status":"publish","type":"post","link":"https:\/\/www.mee-inc.com\/blog\/?p=821","title":{"rendered":"Pinpointing Microscopic Targets"},"content":{"rendered":"<p><span class=\"module-10 text-container\">To allow more consistent metallographic section preparation of very small targets, MEE has added a Leica EM\/TXP to our selection of sectioning tools. The Leica EM\/TXP is specifically designed for more precise and efficient targeting of points of interest in very small specimens. A combination mill\/grinder\/polisher and stereomicroscope, the Leica EM\/TXP, allows the technician to observe the sample during preparation improving accuracy in locating microscopic targets.<\/span><\/p>\n<p><a href=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2018\/03\/leica-em.jpg\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-822 size-thumbnail\" src=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2018\/03\/leica-em-150x150.jpg\" alt=\"\" width=\"150\" height=\"150\" srcset=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2018\/03\/leica-em-150x150.jpg 150w, https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2018\/03\/leica-em-300x297.jpg 300w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>To allow more consistent metallographic section preparation of very small targets, MEE has added a Leica EM\/TXP to our selection of sectioning tools. The Leica EM\/TXP is specifically designed for more precise and efficient targeting of points of interest in very small specimens. A combination mill\/grinder\/polisher and stereomicroscope, the Leica EM\/TXP, allows the technician to [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_mi_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[18,21,49,19],"tags":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.5 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Pinpointing Microscopic Targets - MEE<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.mee-inc.com\/blog\/?p=821\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Pinpointing Microscopic Targets - MEE\" \/>\n<meta property=\"og:description\" content=\"To allow more consistent metallographic section preparation of very small targets, MEE has added a Leica EM\/TXP to our selection of sectioning tools. The Leica EM\/TXP is specifically designed for more precise and efficient targeting of points of interest in very small specimens. A combination mill\/grinder\/polisher and stereomicroscope, the Leica EM\/TXP, allows the technician to [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.mee-inc.com\/blog\/?p=821\" \/>\n<meta property=\"og:site_name\" content=\"MEE\" \/>\n<meta property=\"article:published_time\" content=\"2018-04-19T21:22:48+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2018-04-19T21:22:49+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.mee-inc.com\/blog\/wp-content\/uploads\/2018\/03\/leica-em-150x150.jpg\" \/>\n<meta name=\"author\" content=\"MEE Inc\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"MEE Inc\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=821\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/?p=821\",\"name\":\"Pinpointing Microscopic Targets - MEE\",\"isPartOf\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\"},\"datePublished\":\"2018-04-19T21:22:48+00:00\",\"dateModified\":\"2018-04-19T21:22:49+00:00\",\"author\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\"},\"breadcrumb\":{\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=821#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.mee-inc.com\/blog\/?p=821\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/?p=821#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.mee-inc.com\/blog\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Pinpointing Microscopic Targets\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#website\",\"url\":\"https:\/\/www.mee-inc.com\/blog\/\",\"name\":\"MEE\",\"description\":\"Materials Evaluation and Engineering, Inc\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.mee-inc.com\/blog\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-US\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/6efc292637e6012010685fea7776c224\",\"name\":\"MEE Inc\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.mee-inc.com\/blog\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/d77d1b7558074693dc30ea601c1f8361?s=96&d=mm&r=g\",\"caption\":\"MEE Inc\"},\"sameAs\":[\"http:\/\/www.mee-inc.com\"],\"url\":\"https:\/\/www.mee-inc.com\/blog\/?author=2\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Pinpointing Microscopic Targets - MEE","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.mee-inc.com\/blog\/?p=821","og_locale":"en_US","og_type":"article","og_title":"Pinpointing Microscopic Targets - MEE","og_description":"To allow more consistent metallographic section preparation of very small targets, MEE has added a Leica EM\/TXP to our selection of sectioning tools. 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