Materials Characterization Seminar
Senior Scientist, Dieter Scholz and Materials Engineer, Neal Hanke will be speaking at the Minnesota chapter of ASM 2018 seminar in Brooklyn Park, MN on February 28. The Materials Characterization Seminar is an opportunity to learn about the most recent developments in advanced characterization techniques and their practical applications. Dieter will be speaking on Broad […]
Technical Paper Published
“Broad Beam Ion Milling for Microstructure Characterization,” a technical paper authored by MEE staff Larry Hanke, Kurt Schenk and Dieter Scholz, was recently published in the online version of Materials Performance and Characterization. An abstract of the article is available on the ASTM International digital library site. Ion beam milling is a unique method of sample preparation that complements and significantly extends […]
Microscopy and Microanalysis 2015
Last week, Larry Hanke presented a paper co-authored with Dieter Scholz at the 2015 Microscopy Society of America (MSA) annual meeting in Portland, Oregon. The presentation, Microstructure Enhancement Using Ion Beam Milling, was based on work done in our laboratory preparing challenging samples for microscopic evaluation. These images show a gold ball bond on an integrated circuit. In the […]
Broad-Beam Ion Milling
Senior Scientist, Dieter Scholz, spent a day at the SMTA (Surface Mount Technology Association) 2015 Midwest Expo talking with attendees about the advantages of the Broad-Beam Ion Milling. Ion Beam Milling provides an additional level of quality and clarity for critical and difficult-to-prepare samples. It is particularly useful for cross sections of semi-conductor devices, sectioning […]