Electronics

Electronics

The constantly evolving electronics industry presents materials problems that require specialized equipment and creative solutions. MEE has long been a leader in laboratory testing applying traditional and advanced analytical methods. MEE helps you address your product challenges efficiently and effectively.

Flip-chip IC bump separation at intermetallic layer

Typical MEE Projects for Electronic Components

  • Evaluation of PCB, IC, and pad contamination
  • Competitive analysis/reverse engineering of circuit boards and assemblies
  • Evaluation of BGA and flip-chip bump failures
  • Precision cross sectioning of buried features
  • Evaluation of flexible circuitry and layer stackups
  • Analysis of electrical failures due to dendritic growth and tin whiskers
  • Cross section and precision measurement of PCB layering and wafer metallization
  • Failure analysis of wirebond defects and solder connections
  • Composition analysis for platings including electroless nickel and ENIG
  • Examination and decapsulation of packaged IC devices

Contact us today to learn more. 

Featured Case Study
Cracking Capacitors

Several printed circuit board (PCBs), each with 5 multilayer ceramic capacitors (MLCCs), were evaluated to characterize the capacitors. Each PCB was about 1 in. by 1 in. square. Four of the MLCCs were parallel to one edge of the PCB, and one MLCC was oriented at 90° to the others….