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Contact MEE
Laboratory Expertise
Scanning Electron Microscopy (SEM)
Field Emission SEM (FESEM)
Energy Dispersive X-ray Spectroscopy (EDS)
Fourier Transform-Infrared Spectroscopy (FTIR)
Broad-Beam Ion Milling
Light Microscopy
Microsectioning (Precision Cross Sections)
Metallography
Corrosion Testing
Rockwell Hardness Testing
Brinell Hardness Testing
Microhardness Testing
Durometer Hardness Testing
Tension/Compression Testing
Custom Test Design
Testing to Industry Standards
Engineering Consulting
Failure Analysis
Corrosion Evaluation
Fracture Analysis
Materials, Process and Product Evaluation
Expert Witness
Forensic Engineering Inspections
Sample Technical Reports
Industries Served
Medical Device
Industrial
Electronics
Forensic
About Us
Staff
Testimonials
Contact MEE
Laboratory Expertise
Scanning Electron Microscopy (SEM)
Field Emission SEM (FESEM)
Energy Dispersive X-ray Spectroscopy (EDS)
Fourier Transform-Infrared Spectroscopy (FTIR)
Broad-Beam Ion Milling
Light Microscopy
Microsectioning (Precision Cross Sections)
Metallography
Corrosion Testing
Rockwell Hardness Testing
Brinell Hardness Testing
Microhardness Testing
Durometer Hardness Testing
Tension/Compression Testing
Custom Test Design
Testing to Industry Standards
Engineering Consulting
Failure Analysis
Corrosion Evaluation
Fracture Analysis
Materials, Process and Product Evaluation
Expert Witness
Forensic Engineering Inspections
Sample Technical Reports
Industries Served
Medical Device
Industrial
Electronics
Forensic
Leica EM TXP
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Sample Preparation
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Pinpointing Microscopic Targets
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Leica EM TXP
