Technical Paper Published

posted December 2016

“Broad Beam Ion Milling for Microstructure Characterization,”  a technical paper authored by MEE staff Larry Hanke, Kurt Schenk and Dieter Scholz, was recently published in the online version of Materials Performance and Characterization.  An abstract of the article is available on the ASTM International digital library site.

Ion beam milling is a unique method of sample preparation that complements and significantly extends the capabilities of the traditional microscopy and metallographic laboratories. Our online Handbook of Analytical Methods for Materials (HAMM) offers basic explanations, typical applications and sample requirements for Ion Milling.