Materials Characterization Seminar

posted February 2018

Neal Hanke, P.E.

Dieter Scholz

Senior Scientist, Dieter Scholz and Materials Engineer, Neal Hanke will be speaking at the Minnesota chapter of ASM 2018 seminar in Brooklyn Park, MN on February 28. The Materials Characterization Seminar is an opportunity to learn about the most recent developments in advanced characterization techniques and their practical applications.

Dieter will be speaking on Broad Beam Ion Milling in Sample Preparation and Neal’s presentation is on the Determination of Nitinol Transformation Temperatures by the Bend and Free Recovery Method.

We weren’t familiar with the Minneapolis city flag until just recently, but were pleasantly surprised to see one of the symbols on it is a microscope. That seems fitting to us! Microscopes are one of the most important tools we use at MEE to provide our clients in the medical device, industrial and electronics industries with high-quality materials characterization for their advanced materials and critical components.

MEE has three scanning electron microscopes (and a new one coming this summer) and a light microscopy laboratory equipped with a variety of light microscopes with magnifications ranging from 5X to 2,400X.

There is a small contingent of Minneapolis citizens advocating for an update of the flag. We would hate to see the microscope image go away but either way, MEE will always be flying the microscopy banner.

 

City of Minneapolis Flag